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| Categories | SEM Sample Stage |
|---|---|
| Delivery Time: | 30~60 work days |
| Cooling/Heating Method: | Liquid nitrogen cooling,Resistance heating |
| Temperature Range: | -180℃~200℃ |
| Sample Holder: | Copper ;φ30mm |
| Dimensions: | 100mm*41mm*36.5mm |
| Optional: | Adapter Plate/Customized Liquid Nitrogen Tank/Computer Host/ Customed Temperature Control Software |
| Name: | Hot And Cold Stage |
| Temperature Stability: | ±0.1℃ |
| Heating/Cooling Rate: | Maximum Heating Rate:30℃/min,Maximum Cooling Rate:15℃/min |
| Net Weight: | 0.2kg |
| Basic Configuration: | TNEX*1、SEM Rotating Heating and Cooling Stage*1、 Cooling controller*1、Liquid Nitrogen Tank*1、Cables、Tubing、and Accessories |
| Price: | CNY 30000~600000/set |
| Brand Name: | GoGo |
| Model Number: | SCH200-RS |
| Certification: | ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018 |
| Place of Origin: | Suzhou, China |
| MOQ: | 1 |
| Payment Terms: | T/T |
| Supply Ability: | 1set/day |
| Packaging Details: | Cardboard box + wooden box |
| Company Info. |
| XihaoT (Suzhou) Technology Co., Ltd. |
| Verified Supplier |
| View Contact Details |
| Product List |
Five-Axis Cryo/Heating SEM Sample Stage with Non-Invasive Integration and -180℃~200℃ Temperature Range for FIB/SEM
The GoGo SCH200-RS is an advanced, multi-axis SEM Sample Stage engineered to revolutionize in-situ experiments within focused ion beam (FIB) and scanning electron microscope (SEM) systems. It provides precise five-axis (X/Y/Z/R/T) positioning control, enabling unparalleled flexibility to translate, rotate, and tilt the sample under the electron/ion beam. Coupled with a broad temperature range from -180°C to 200°C and excellent stability (±0.1°C), this stage allows researchers to perform complex nanomanipulation, cross-sectioning, and dynamic observation of thermal processes from any optimal angle. Designed for non-invasive integration and featuring superior electromagnetic interference (EMI) shielding, this specialized SEM Sample Stage is the ultimate tool for correlative microscopy and advanced materials research at the nanoscale.
Unmatched Five-Axis Positioning Flexibility: This SEM Sample Stage provides comprehensive X, Y, Z translation, 360° rotation (R), and tilt (T), allowing you to optimally orient your sample for FIB milling, EBSD analysis, or high-resolution imaging without breaking vacuum or temperature conditions.
Optimized for Integrated FIB/SEM Workflows: Specifically designed for dual-beam systems, the stage's compact mechanics and precise control enable intricate in-situ experiments such as lamella preparation at specific temperatures, observation of thermal effects on nanostructures, or mechanical testing within the chamber.
Non-Invasive Integration with Full Performance: Like our other stages, it integrates via a custom external flange, requiring no internal modification to your FIB/SEM. Its robust EMI shielding ensures no interference with sensitive electron/ion optics, detectors, or gas injection systems (GIS).
Precision Thermal Control for Dynamic Studies: Delivers stable thermal environments from cryogenic to moderate-high temperatures. The integrated control system allows for precise ramps and holds, enabling real-time study of phase changes, thin-film reactions, or polymer behavior under the beam.
Certified, Application-Focused Design: Manufactured under ISO 9001, 14001, and 45001 certified processes, this SEM Sample Stage is built to meet the rigorous demands of nanotechnology research, providing reliability for complex, long-duration in-situ experiments.
| Parameter | Specification |
|---|---|
| Model / Brand | SCH200-RS / GoGo |
| Core Feature | 5-Axis Positioning (X, Y, Z, Rotation, Tilt) for FIB/SEM |
| Integration | Non-Invasive, External Flange |
| Temperature Range | -180°C to 200°C |
| Temperature Stability | ±0.1°C |
| Positioning | X/Y/Z/R/T Full Motion Control |
| Key Application | In-Situ Nanomanipulation & Cross-Sectioning in FIB/SEM |
| Sample Holder | Copper, φ30mm |
Target Markets & Clients
This sophisticated SEM Sample Stage is critical for cutting-edge
research facilities in key regions including Southeast Asia, the
Middle East, Russia, and Africa. It is an essential instrument for
university nanotechnology centers, corporate R&D labs in
semiconductors and advanced materials, and government research
institutes utilizing dual-beam FIB/SEM systems.
What is the primary benefit of five-axis positioning in an SEM
Sample Stage?
It allows you to position any specific region of a sample into the
ideal geometry for the task—whether for perpendicular FIB milling,
achieving optimal EBSD tilt, or aligning a feature for
high-resolution imaging—all without manual handling, saving immense
time and preserving experiment integrity.
Is this stage compatible with all major FIB/SEM brands?
Yes. The SEM Sample Stage is designed with a universal integration
philosophy. We provide customized flange solutions and adapter
plates to ensure compatibility with systems from leading
manufacturers like Thermo FEI, Zeiss, TESCAN, and Hitachi.
Can I perform in-situ lift-out or nanoprobing with this stage?
Absolutely. The combination of precise multi-axis movement and
temperature control makes this stage ideal for complex in-situ
workflows, including heating/cooling a sample during nanoprobing
electrical tests or maintaining a lamella at a specific temperature
during transfer.
Does the motion or heating generate vibration that affects imaging?
No. The stage is engineered for smooth, stable motion and
incorporates effective vibration isolation. Combined with its EMI
shielding, this ensures that both imaging resolution and analytical
precision are maintained during all operations.
What is included to get started?
The package includes the five-axis SEM Sample Stage assembly, a
custom vacuum flange for your specific chamber port, a cooling
controller for liquid nitrogen management, a liquid nitrogen tank,
TNEX control software, and all necessary cables and accessories for
immediate integration.
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